E din iec 47 co 1082 1989 01 1 1 1989
Pro vyhledávací frázi E din iec 47 co 1082 1989 01 1 1 1989 jsme na našem vyhledávači našli 26 výsledků. Nenašli jste přesně to, co jste hledali? Zkuste frázi E din iec 47 co 1082 1989 01 1 1 1989 trochu pozměnit a opět zadat do vyhledávacího pole. Pevně věříme, že produkt, který hledáte v naší nabídce na srovnávači CoChceš.cz naleznete!
E DIN IEC 47(CO)1082:1989-01 1.1.1989
Neplatná norma E DIN IEC 47(CO)1082:1989-01 Semiconductor devices; measuring method for radiant power or forward current of LEDs, IREDs and laser diodes; identical with IEC 47(Central Office)1082.
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E DIN IEC 47(CO)1037:1989-01 1.1.1989
Neplatná norma E DIN IEC 47(CO)1037:1989-01 Semiconductor devices; amendment to the sectional specification for integrated circuits; subgroups B5, C5, C7; identical with IEC 47(Central Office)1037.
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E DIN IEC 47(CO)1041:1989-01 1.1.1989
Neplatná norma E DIN IEC 47(CO)1041:1989-01 Semiconductor devices; measuring method of transition time for snap-off- diodes; identical with IEC 47(Central Office)1041.
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E DIN IEC 47(CO)1044:1989-01 1.1.1989
Neplatná norma E DIN IEC 47(CO)1044:1989-01 Digital integrated circuits; terms and description of test patterns for memory testing; identical with IEC 47(Central Office)1044.
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E DIN IEC 47(CO)1049:1989-01 1.1.1989
Neplatná norma E DIN IEC 47(CO)1049:1989-01 Semiconductor devices; supplement to the sectional specification for integrated circuits; correlated measurements; identical with IEC 47/47A(Central Office)1049/173.
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E DIN IEC 47(CO)1084:1989-04 1.4.1989
Neplatná norma E DIN IEC 47(CO)1084:1989-04 Semiconductor devices; mechanical and climatic test methods; amendment to IEC 60749; identical with IEC 47(Central Office)1084.
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E DIN IEC 47(CO)1053-2:1989-03 1.3.1989
Neplatná norma E DIN IEC 47(CO)1053-2:1989-03 Semiconductor devices; internal visual examination; procedure for discrete semiconductors; identical with IEC 47(Central Office)1053-II.
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E DIN IEC 47(CO)1154:1989-11 1.11.1989
Neplatná norma E DIN IEC 47(CO)1154:1989-11 Semiconductor devices; PIN photodiodes for fibre optic systems; additional characteristics; identical with 47(Central Office)1154.
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E DIN IEC 47(CO)1071:1989-05 1.5.1989
Neplatná norma E DIN IEC 47(CO)1071:1989-05 Semiconductor devices; drawing family PLCC, form E for inclusion in IEC 60191-2; dimensions; identical with IEC 47(Central Office)1071.
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E DIN IEC 47(CO)1051:1989-05 1.5.1989
Neplatná norma E DIN IEC 47(CO)1051:1989-05 IEC quality assessment system for electronic components; blank detail specification: integrated digital C MOS circuits, series 4000 B and 4000 UB; identical with IEC 47/47A(Central Office)1051/175.
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E DIN IEC 47(CO)1054:1989-08 1.8.1989
Neplatná norma E DIN IEC 47(CO)1054:1989-08 Semiconductor devices; mechanical and climatic test methods; supplements to IEC 749; damp heat; identical with IEC 47(Central Office)1054.
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E DIN IEC 47(CO)1092:1989-04 1.4.1989
Neplatná norma E DIN IEC 47(CO)1092:1989-04 Semiconductor devices; amendment to the generic specification; IEC 60747-10/QC 700000; identical with IEC 47(Central Office)1092.
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E DIN IEC 47(CO)1116:1989-05 1.5.1989
Neplatná norma E DIN IEC 47(CO)1116:1989-05 Semiconductor devices; amendment to the generic specification IEC 60747-10; accelerated test procedures; identical with IEC 47/47A(Central Office)1116/205.
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E DIN IEC 47(CO)985:1989-04 1.4.1989
Neplatná norma E DIN IEC 47(CO)985:1989-04 IEC quality assessment system for electronic components: blank detail specification for bipolar transistors for switching applications; identical with IEC 47(Central Office)985.
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E DIN IEC 47(CO)1070:1989-05 1.5.1989
Neplatná norma E DIN IEC 47(CO)1070:1989-05 Semiconductor devices; packages for surface mounted devices; definition of the pattern of terminal land areas; identical with IEC 47(Central Office)1070.
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E DIN IEC 47(CO)1074:1989-05 1.5.1989
Neplatná norma E DIN IEC 47(CO)1074:1989-05 Semiconductor devices - Measuring methods for forward recovery time of rectifier diodes and signal diodes; Identical with IEC 47(Central Office)1074.
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E DIN IEC 47(CO)1108:1989-08 1.8.1989
Neplatná norma E DIN IEC 47(CO)1108:1989-08 Semiconductor devices; terms and definitions for leakage current of analogue signal switching circuits; identical with IEC 47(Central Office)1108.
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E DIN IEC 1(CO)1262-702:1989-01 1.1.1989
Neplatná norma E DIN IEC 1(CO)1262-702:1989-01 International electrotechnical vocabulary; chapter 702 of IEV: oscillations, signals and related devices; identical with IEC 1(IEV 702)(Central Office)1262-I to III and IEC 1(IEV 702)(Central Office)1279.
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E DIN IEC 84(CO)55:1989-01 1.1.1989
Neplatná norma E DIN IEC 84(CO)55:1989-01 ENG equipment; interfaces; identical with IEC 84(Central Office)55.
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E DIN IEC 47A(CO)168:1989-01 1.1.1989
Neplatná norma E DIN IEC 47A(CO)168:1989-01 Analogue integrated circuits; measuring methods; common-mode input voltage range; identical with IEC 47A(Central Office)168.
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E DIN IEC 55(CO)367:1989-01 1.1.1989
Neplatná norma E DIN IEC 55(CO)367:1989-01 Methods of test for winding wires; part 5: electrical properties, item 6; test 19, dielectric loss tangent (tan (delta)); identical with IEC 55(Central Office)367.
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E DIN IEC 55(CO)372:1989-01 1.1.1989
Neplatná norma E DIN IEC 55(CO)372:1989-01 Packaging of winding wires; cylindrical barrelled delivery spools; specification for non-returnable spools made from thermoplastic material; identical with IEC 55(Central Office)372.
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E DIN IEC 55(CO)373:1989-01 1.1.1989
Neplatná norma E DIN IEC 55(CO)373:1989-01 Packaging of winding wires; taper barrelled delivery spools; specification for non-returnable spools made from thermoplastic material; identical with IEC 55(Central Office)373.
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E DIN IEC 55(CO)374:1989-01 1.1.1989
Neplatná norma E DIN IEC 55(CO)374:1989-01 Packaging of winding wires; taper barrelled delivery spools; basic dimensions of containers for taper barrelled delivery spools; identical with IEC 55(Central Office)374.
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E DIN IEC 47A(CO)181:1989-01 1.1.1989
Neplatná norma E DIN IEC 47A(CO)181:1989-01 Semiconductor devices; sectional specification for integrated film and hybrid circuits; qualification approval procedure; identical with IEC 47A(Central Office)181.
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E DIN IEC 50(CO)214:1989-01 1.1.1989
Neplatná norma E DIN IEC 50(CO)214:1989-01 Electrical engineering; basic environmental testing procedures; test Ue: robustness of terminations of surface mounting devices (SMD) and of their solder joints; amendment to IEC 60068-2-21; identical with IEC 50(Central Office)214.
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